Nuclear Physics and Atomic Energy

ядерна ф≥зика та енергетика
Nuclear Physics and Atomic Energy

  ISSN: 1818-331X (Print), 2074-0565 (Online)
  Publisher: Institute for Nuclear Research of the National Academy of Sciences of Ukraine
  Languages: Ukrainian, English, Russian
  Periodicity: 4 times per year

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Nucl. Phys. At. Energy 2016, volume 17, issue 4, pages 400-405.
Section: Engineering and Methods of Experiment.
Received: 14.07.2016; Accepted: 19.10.2016; Published online: 10.04.2017.
PDF Full text (ua)
https://doi.org/

Microdetector system for speedy X-ray studies

O. S. Kovalchuk1,*, V. V. Burdin2, V. A. Kyva1, V. M. Militsiya1, M. . Minakov2, Ie. O. Petrenko1,
V . M. Pugatch1, D. I. Storozhyk1, J. Heuser3, S. O. Firstov2, A. V. Chaus1


1 Institute for Nuclear Research, National Academy of Sciences of Ukraine, Kyiv, Ukraine
2 Institute for Problems in Materials Science, National Academy of Sciences of Ukraine, Kyiv, Ukraine
3 GSI Helmholtzzentrum fur Schwerionenforschung, Darmstadt, Germany


*Corresponding author. E-mail address: lexxkov@kinr.kiev.ua

Abstract: Characteristics of 512-channel micro-detection system for the study of fast processes in metals during heating/cooling at high-speed radiography installation was presented. The position, width and intensity of diffraction peaks of the scattered X-rays was measured and displayed in real time depending on the temperature of the test sample (20 - 1500 °C). The position sensitivity of the system based on silicon microstrip sensors read out by commercial XDAS data acquisition system is 40 μm for the scattering angle of X-rays 30° < Θ < 75°.

Keywords: X-rays diffraction, position sensitive detectors, transient phase transformations, temperature dependence of phase transformations in metals, microstrip silicon detectors.

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