ядерна ф≥зика та енергетика
1818-331X (Print), 2074-0565 (Online)
Microdetector system for speedy X-ray studiesO. S. Kovalchuk1,*, V. V. Burdin2, V. A. Kyva1, V. M. Militsiya1, M. V. Minakov2, Ie. O. Petrenko1,
Abstract: Characteristics of 512-channel micro-detection system for the study of fast processes in metals during heating/cooling at high-speed radiography installation was presented. The position, width and intensity of diffraction peaks of the scattered X-rays was measured and displayed in real time depending on the temperature of the test sample (20 - 1500 °C). The position sensitivity of the system based on silicon microstrip sensors read out by commercial XDAS data acquisition system is 40 μm for the scattering angle of X-rays 30° < Θ < 75°.
Keywords: X-rays diffraction, position sensitive detectors, transient phase transformations, temperature dependence of phase transformations in metals, microstrip silicon detectors.References:
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