Nuclear Physics and Atomic Energy


Nuclear Physics and Atomic Energy

  ISSN: 1818-331X (Print), 2074-0565 (Online)
  Publisher: Institute for Nuclear Research of the National Academy of Sciences of Ukraine
  Languages: Ukrainian, English, Russian
  Periodicity: 4 times per year

  Open access peer reviewed journal


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Nucl. Phys. At. Energy 2017, volume 18, issue 3, pages 245-253.
Section: Nuclear Physics.
Received: 01.06.2017; Accepted: 12.10.2017; Published online: 28.12.2017.
PDF Full text (ua)
https://doi.org/10.15407/jnpae2017.03.245

Design, commissioning and first measurements at the LEETECH spectrometer

D. Attie1, S. Barsuk2, O. Bezshyyko3, L. Burmistrov1, A. Chaus1, P. Colas1, O. Fedorchuk3, L. Golinka-Bezshyyko3, *, I. Kadenko3, V. Krylov2,3, V. Kubytskyi2, R. Lopez4, H. Monard2, V. Rodin3, M. Titov1, D. Tomassini4, A. Variola2

1 Commissariat of Nuclear and Alternative Energy, Institute for the Study of Fundamental Laws of Physics (CEA IRFU), Saclay, France
2 Linear Accelerator Laboratory (LAL), Orsay, France
3 Kyiv National Taras Shevchenko University, Kyiv, Ukraine
4 European Center for Nuclear Research, Geneva, Switzerland


*Corresponding author. E-mail address: lyalka@univ.kiev.ua; lyalkagb@gmail.com

Abstract: The LEETECH (Low Energy Electron TECHnique) electron test beam facility has been designed and manufactured at Laboratoire de lAccelerateur Lineaire (Orsay, France). Energy of electron beam can vary from 100 keV to 5 MeV. Two measurement sessions with application of the diamond sensor and the Micromegas/InGrid tracking module characterization were performed. Complete facility design with the Geant4 simulation, mechanical design, implementation of remote control and readout system is presented. An option to generate the electron bunches including a few particles only is confirmed, the obtained results are in rather good agreement with the corresponding simulation within uncertainty. Main results with the preliminary analysis from the Micromegas/InGrid measurement session are also presented.

Keywords: Micromegas, InGrid, PHIL photoinjector, test beams, diamond detector, Micromegas/InGrid.

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